Laser-induced X-ray fluorescence and electron-based X-ray emission analysis of multi-layer material

In this study, we analyzed the X-ray fluorescence of multi-layer material with a laser-induced and electrons. The laser plasma-based sources were generated by femtosecond Ti: sapphire source, optimized for measurement. three types stainless steel, copper-covered steel Korean 10 Won coins measured using compact relatively low intensity. Using difference in penetration depth between X-rays electrons, surface interior materials can be simultaneously. By combining these two complementary sources, provide valuable information about even laser.